STANDARDIZED OPTICAL METROLOGY ALGORITHMS
Provide MTF algorithm based on edge and slit method
Coming soon
Coming soon
We provide optical metrology algorithms that are customized to our customer’s needs. Examples of our work include:
- Visual positioning algorithms based on customized patterns
- Image fusion algorithms
- Image stitching algorithms
Our professional software team provides user-friendly standalone applications and software development kits (C++, Python) that support interoperability of multiple development platforms (Matlab, Labview, Teststand, etc). Let us help you optimize your data capture and assessment!